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U Nified Model for Self-limiting Hot-Carrier Degradation in Ldd N-Mopdfet'S by
  • Ang, D. S
  • ling, C. H
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Erasur Generation and Interleaving for Meteor -Burst Communications with Fixed-Rate and Varable-Rate Coding. by
  • Wilkins, C. S
  • Baum, C. W
Source: Ieee Transactions on Communications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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