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Efficient Transient Simulation of High-Speed Interconnects Characterized by Sampled Data by
  • Beyene, Wendemagegnehu T
  • Schutt-Aine, J. E
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Analysis ofAnomalous Dip in Scattering Parameter S22 of Ingap-Gaas Heterojuction Bipolar Transistors (Hbts) by
  • Tu, H. Y
  • Lin, Y. S
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
High-Frequency Charactrization of Twisted-Pair Cable by
  • Schutt-Aine, J.E
Source: Ieee Transactions on Communications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Durable Laboratory Apparatus for Measuement of Soil Dielectric Properties by
  • Curtis, John O
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Closed for m Theory for Calibrating A Dual Six-Port Network Analyzer. by
  • Krekels, H. G
  • Schiek, B
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Results of Network Analyazer Measurements with Leakage Errors - Corrected with Direct Calibration Techniques. by
  • Heuermann, H
  • Schiek, B
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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