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		Minimax Approach to Accelerated life Tests by Ginebra, Josep Sen, Ananda Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Minimax Design of Fir Digital All-Pass Filters. by Chieu, B. C Lin, C. S Chao, H. C Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing) Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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