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Extremely Scaled Double-Gate Cmos Performance Projections, Including Gils-Controlied Off-State Current by
  • Chong, Yan
  • Fossum, Jerry G
  • Kim, Keunwoo
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Testing and Diagnostics of Cmos Circuits Using Light Emission from offf-State Leakage Current by
  • Stellari, Franco
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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