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Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits by
  • Bushnell, Michael L [author]
  • Agrawal, Vishwani D [author]
Series: Frontiers in Electronic Testing
Material type: Text Text
Language: English
Publication details: New York : Springer, c2000
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.395 BUS.
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Built in Test for VLSI Pseudorandom Techniques by
  • Bardell, Paul H [author]
  • Mcanney, William H [author]
  • Savir, Jacob [author]
Material type: Text Text
Language: English
Publication details: New York : John Wiley, c1987
Online access:
Availability: Items available for loan: Circulation Section (2)Location, call number: Circulation Section 621.395 BAR, ...
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Digital Circuit Testing and Testability by
  • Lala, Parag K [author]
Material type: Text Text
Language: English
Publication details: San Diego : Academic Press, c1997
Online access:
Availability: Items available for loan: Circulation Section (2)Location, call number: Circulation Section 621.3950287 LAL, ...
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