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		Rapid Thermal Postoxidation Anneal Engineering in Thin Gate Oxides with Al Gates by Chen, Chih-Yao Hwu, Jenn-GWO Jeng, Ming-Jer Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Rapid Thermal Anneal of Gate Oxides for Low Thermal Budget Tft'S by Bhat, Navakanta Wang, Albert W SARaswat, Krishna C Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Rapjkid Transaction-Undo Recovery Using Twin-Page Storage Management by Wu, Kun-Lung Fuchs, W. Kent Source: IEEE Transactions on Software Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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