Your search returned 10 results.

Results
		Maximal Diagnosis of Interconnects of Random Access Memories by Zhao, Jun Meyer, F.J Lombardi, Fabrizio Park, Nohpili Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Functional Testing Method for Microprocessors by Shen, li Su, Stephen Y.H Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Fault-Diagnosis for a Class of Multistage Interconnection Networks by Wu, Chuan-lin Feng, Tse-Yun Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Ic Bridge Fault Modeling for Ip Blocks Using Neural Network-Based Vhdl Saboteurs by Shaw, Donald B Al-Khalili, A. J Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Rectilinear-Monotone Polygonal Fault Block Model for Fault-tolerant Minimal Routing in Mesh by Wang, Dajin Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		AssessingApplicability of Fault-Proneness Models Across Object-Oriented Software Projects by Briand, L C Source: Ieee Transactions on Software Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Efficient Tests for Realistic Faults in Dual-Port Srams by Hamdioui, Said Goor, Ad J. Van De Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Path Delay Fault Simulation of Sequential Circuits. by Bushnell, M. L Agrawal, V. D Chakraborty, T. J Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Faults Models and Test for A 2-Bit-Per-Cell Mldram. by Redeker, Michael F.Cockburn, Bruce G.Elliott, Duncan Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Fault tolerance Via Weight Noise in Analogy Vlsi Implementations of Mlp'S - A Case Study with Epsilon. by Murray, A. F Edwards, P. J Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing) Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Visit counter For Websites

Copyright © Engr Abul Kalam Library, NEDUET, 2024

Report a problem