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A 1-V, 8-Bit Successive Approximation Adc in Standard Cmos Process by
  • Mortezapour, S
  • Lee, Edward K. F
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
New Submicron Hbt Ic Technology Demonstrate Ultra-Fast,Power Integrated Circuits by
  • Hafizi, Madjid
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
offset Compensation in Comparators with Minimum Input-Referred Supply Noise by
  • Wong, Koon-Lun Jackie
  • Yang, Chih-Kong Ken
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Low-Noise Latching Comparator Probe for Wave for m Sampling Applications by
  • Bergman, David I
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
High-Performance and Power-Efficient Cmos Comparators by
  • Huang, Chung-Hsun
  • Wang, Jinn-Shyan
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Compatibility Equations InTheory of Elasticity by
  • andrianov, Ignor V
Source: Transactions ofAsme, Journal of Vibration and Acoustics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Analysis of Noise Enhanced Information Transmission in An Array of Comparators by
  • Mcdonnell, John
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Limitations of A Relaxation in Capacitance Measurements. by
  • Nakayama, M
  • Liu, Y
  • Chen, S
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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