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		Transistor Noise in Sige Hbt Rf Technology by Niu, Guofu Cressler, John D Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Noise Parameter Optimization of Uhv/Cvd Sige Hbt'S for Rf and Microwave Applications by Niu, Guofu Ansley, Wililam E Webster, Charles S Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Lumped Scalsb Modele for Silicon Integrated Spiral Inductors by Scuderi, Angelo Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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