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		Obdd-Based Evaluation of K-Terminal Network Reliability by Yeh, Fu-Min Lu, Shyue-Kung Kuo, Sy-Yen Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Efficient Computation of Marginal Reliability-Importance for Reducible+ Networks by Yuang, M. C Hsu, Steen J Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Determining Terminal-Pair Reliability Based on Edge Expansion Diagrams Using Obdd by Kuo, Sy-Yen Lu, Shyue-Kung Yeh, Fu-Min Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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