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Modeling and Analysis of Multichip Module Power Supply Planes by
- Lee, Keunmyung
- Barber, Alan
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article; Format:
print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Electrical Test of Multichip Substrates by
- Economikos, Laertis
- Morrison, Thomas
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article; Format:
print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Minimal Ic Pretest Requirements for Multichip Modules by
- Daum, Wolfgang
- Burdick, Wililam E
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article; Format:
print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Power Cycling and Stress Variation in a Multichip Module by
- Sur, Biswajit
- Turlik, Lwona
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article; Format:
print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Long Lossy lines (L3) and Their Impact Upon Large Chip Performance by
- Davidson, Evan E
- Mccredie, Bradley D
- Vilkelis, Valter V
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article; Format:
print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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