Your search returned 4 results.

Results
		Quantitative Measurement of Channel Temperature of Gaas Devices for Reliable life-Time Prediction by Mittereder, Jeffrey A Roussos, Jason A anderson, Waliace T Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Reliability life-Testing and Failure-Analysis of Gaas Monolithic Ku-Band Driver Amplifiers by anderson, Waliace T Christianson, Keith A Roussos, Jason A Mittereder, Jeffrey A Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Implementation of Galilum Arsenide Multichip Digital Circuit Operating at 500-1000 Mhz Clook Rates Using a Si/Cu/Sio2 Mcm-D Technology by Gilbert, Barry K Randali, Barbara A Tuckerman, David B Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Some Properties of Flash Evaporated Galilum Arsenide Thin Films by Islam, M.N Mitra, S. K Source: Pakistan Journal of Scientific and Industrial Research Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search