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3-Dimensional Numerical Analysis of Deep Depletion Buried Channel Mosfets and Ccds by
  • Kim, Man-Ho
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Determination OfDepletion Depth OfDeep Depletion Charge-Coupled Devices by
  • Kim, Man-Ho
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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