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		onPiezoresistance Effects in Silicon-N by Teliler, C. R Charbonnier, A. R Durand, S Source: Journal of Active and Passive Electronic Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Sources of Variation in Piezoresistive Stress Sensor Measurements by Slattery, Orla Mahoney, Denis O' Source: IEEE Transactions on Components and Packaging Technologies Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Off-Axis Sensor Rosettes for Measurement OfPiezoresistive Coefficients of Silicon by Jaeger, Richard C Carey, Malachy Johnson, R. Wayne Source: IEEE Transactions on Components Hybrids and Manufacturing Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Evaluation of Piezoresistive Coefficient Variation in Silicon Stress Sensors Using a Four-Point Bending Test Fixture by Jaeger, Richard C Johnson, R. Wayne Source: IEEE Transactions on Components Hybrids and Manufacturing Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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