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Effect of Cation Disorder onSolubility and Result of Doping in Oxides by
  • Norby, Truls
  • Xing, Wen
Source: International Journal of Hydrogen Energy
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Measurement Time Reduction for Generation lifetimes by
  • Lee, Sang-Yun
  • Schroder, Dieter K
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Measurement of Differential and Actual Recombination Parameters on Crystalilne Silicon Wafers by
  • Schmidt, Jan
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Bidimensional Lifetime Control for High-Speed Low P-I - N Recitifiers. by
  • Napoli, E
Source: Ieee Transactions on PowerElectronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Numericl Analysis oflocal Lifetime Control for High-Speed Low-Loss P-I-N Diod Design. by
  • Napoli, Ettore
  • Strollo, G. M
  • Spirito, Paolo
Source: Ieee Transactions on PowerElectronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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