Your search returned 4 results.

Results
		Intra-Gate Length Biasing for Leakage Optimization in 45 Nm Technology Node by Kang, Yesung Source: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		The Physical and Electrical Effects of Metal-Fili Patterning Practices for Oxide Chemical-Mechanical Polishing Processes by Stine, Brian E Boning, Duane S Muthukrishnan, Moorthy Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		The Physical and Electrical Effects of Metal-Fili Patterning Practices for Oxide Chemical-Mechanical Processes by Stine, Brian E Boning, Duane S Berman, Michael Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design for Fixturability (Dff)Methodology for Commodity Parts:A Case Study with Connecting Rod Design by Qureshi, Khurshid A Saitou, Kazuhiro Source: Transactions ofAsme, Journal of Computing and Information Science in Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search