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		Optimization and Characterization of Gate Electrode Dependent Flicker Noise in Silicon Nanowire Tansistors by Anandan, P Mohankumar, N Source: Journal of Electrical Engineering and Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		The Impact of Device Type and Sizing on Phase Noise Mechanisms by Jerng, Albert Sodini, Charles G Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Transistor Noise in Sige Hbt Rf Technology by Niu, Guofu Cressler, John D Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Reducing Mosfet 1/F Noise and Power Consumption by Switched Biasing by Klumkperink, Eric A. M Gierkink, Sander L.J Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Low-Frequency Noise in Submicrometer Mosfets with Hfo2, Hfo2/Al2o3 and Hfalo Gate Stacks by Min, Bigang tobin, Philip J Wang, Fang Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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