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		on Detecting Delay Faults Using Time-To-Digital Converter Embedded in Boundary Scan by Yotsuyanagi, Hiroyuki Makimoto, Hiroyuki Source: IEICE Transactions on Information and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Desing of Self-Checking Fully Differential Circuits and Boards. by Lubaszewski, M Mir, S Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Hierarchical System Test By An Ieee 11490.5 Mtm-Bus Slave-Module Interface Core. by Hong, J. H Tsai, C. H Wu, C. W Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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