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		on Detecting Delay Faults Using Time-To-Digital Converter Embedded in Boundary Scan by Yotsuyanagi, Hiroyuki Makimoto, Hiroyuki Source: IEICE Transactions on Information and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Random Pattern Testability of Delay Faults by Savir, J Mcanney, Wililam H Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Adaptive Path Selection Method for Delay Testing by Jone, Wen-Ben Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Improving Path Delay Testability of Sequential Circuits. by Chakraborty, T. J Agrawal, V. D Bushnell, M. L Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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