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on-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation by
  • Islam, A.K.M. Mahfuzul
  • onodera, Hidetoshi
Source: IEICE Transactions on Information and Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Fabrication of Low Loss Polyimide Optical Waveguides Using Thin-Film Multichip Module Process Technology by
  • Beuthler, Aliyson J
  • Wargowski, David A
  • Singer, Kenneth D
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Process Simplification in Dram Manufacturing by
  • Thakur, R. P. S
  • Ping, E-X
  • Deboer, S. J
  • Jesse, C. A
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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