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Techniques of Bdd/Zdd: Brief History and Recent Activity by
  • Minato, Shin-Ichi
Source: IEICE Transactions on Information and Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Determining Terminal-Pair Reliability Based on Edge Expansion Diagrams Using Obdd by
  • Kuo, Sy-Yen
  • Lu, Shyue-Kung
  • Yeh, Fu-Min
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A New Preprocessing Method for Efficient Construction of Decision Diagrams by
  • Malathi, S. R
  • Sakthivel, P
Source: IEICE TransactionsonFundamentals of Electionics, Communications and Computer Sciences
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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