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Thermal Aware Energy Efficient Alu Design Design on Different Fpga by
  • Kumar, Tanesh
  • Kumar, Pardeep
  • Pandey, Bishwajeet
Source: NED University Journal of Research Formerly NED University Journal of Engineering Research
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Novel High Er Formance Scan Architecture with Dmuxed Scan Flip-Flop for Low Shift Power Testing by
  • Kim, Jung-Tae
  • Kim, Insoo
  • Kim, Yong-Hyun
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Scan Celi Grouping Algorith for Low Power Design by
  • Kim, Insoo
  • Min, Hyoung Bok
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Assessment OfThermal Performance OfPbga Family by
  • Mulgaonker, Shailesh
  • Chambers, B
  • Mahalingam, Mali
Source: IEEE Transactions on Components Packaging and Manufacturing Technology Part A
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Transient Thermal Management of Portable Electronics Using Heat Storage and Dynamic Power Dissipation Control by
  • Cao, lipeng
  • Fisher, Timothy S
Source: IEEE Transactions on Components Packaging and Manufacturing Technology Part A
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
onPower Dissipation in Dynamic Thershold Silicon-Insulator Cmos Inverter by
  • Philip, J.W
  • Chan, C H
  • Chan, Mansun
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Stochastic Wire-Length Distribution for Giascale Integration (Gsi)-PartII Applications to Clock Frequency, Power Dissipation, and Chip Size Estimaton by
  • Davis, Jeffrey A
  • De, Vivek
  • Meindl, James D
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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