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		Direct Lateral Profiling of Hot-Carrier-Induced Oxide Charge and Interface Traps in Thin Gate Mosfet'S by Chen, Chun Ma, T.P Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Face Recognition Using Lda-Based Algorithms by Lu, J Source: Ieee Transactions on Neural Networks Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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