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Determination of An Optimum Set of Testable Components InFault Diagnosis of Analog Linear Circuits. by
  • Cristina, Maria
  • Fedi, Giulio
  • Manetti, Stefano
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Comments on "Linear Circuit Fault Diagnoisis Usingneuromeorphic Analyzers". by
  • Fedi, Giulio
  • Manetti, Stefano
  • Piccirilli, Maria Cristina
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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