Your search returned 2 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
An on-Chip March Pattern Generator for Testing Embedded Memory Cores by
  • W., Li
  • Lee, K. J
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
A Built-In Current Sensor Based on Current-Mode Design. by
  • Lee, K. J
  • Tang, J. J
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Pages
Visit counter For Websites

Copyright © Engr Abul Kalam Library, NEDUET, 2024