Your search returned 3 results.

Results
		An on-Chip March Pattern Generator for Testing Embedded Memory Cores by W., Li Lee, K. J Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Single-Flux-Quantum Counters for Advanced Josephson Primary Voltage Standards by M. S., Pambianchi W., Li J., Coughlin E. N., Talej Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Large Scale Voltage Stability Constrained Optimal Var Planning and Voltage Stability Application Using Existing Opf/Optimal Var Planning tools . by E., Vaahedi Y., Mansour J., Tamby W., Li Source: Ieee Transactions on Power Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search