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Author'S Reply by
  • Tian, M. W
Source: Ieee Transactions on Circuits and Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Worst Case tolerance Analysis of Linear Analog Circuit Using Sensitivity Bands. by
  • Shi, C. J. R
  • Tian, M. W
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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