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Parameterized Rtl Power Models for Soft Macros by
  • Bogliolo, A
  • Corno, Fulvio
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Rt-Level Itc'99 Benchmarks and First Atpg Results. by
  • Squillero, Giovanni
  • Sonza Reorda, Matteo
  • Corno, Fulvio
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Circulr Self-Test Path for Fsms. by
  • Reorda, Matteo Sonza
  • Prinetto, Paolo
  • Corno, Fulvio
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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