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Stability of Microstability Devices of Electrical Metrology by
  • Kyynarainen, J
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Microelectromechanical Systems in Electrical Metrology by
  • Seppa, H
  • Kyynarainen, J
  • Oja, A
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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