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Device Modeling of Ferroelectric Memory Field-Effect Transistor (Femfet) by
  • Lue, H.T
  • Wu, C. J
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Microwave Penetration Depth Measurement for High Tc Superconductors By Dielectric Resonators by
  • Lue, H.T
  • Lue, J T
  • Tseng, T Y
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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