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Influence of Novel Mos Varactors onPerformance of A Fully Integrated Umts Vco in Standard 0.25-Um Cmos Technology by
  • Kraus, R
  • Maget, Judith
  • Tiebout, Marc
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Status and Trends of Power Semiconductor Device Models for Circuit Simulation. by
  • Mattausch, H. J
  • Kraus, R
Source: Ieee Transactions on PowerElectronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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