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		Worst-Case tolerance Analysis of Linear Dc and Ac Electric Circuits by Kolev, L Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Computerized Investigation of Robust Measurement System by Kolev, L Yordanova, S.T Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Comments on "Worst-Case tolerance Analysis of Linear Analog Circuits Ucing Sensitivity Bands by Kolev, L Source: Ieee Transactions on Circuits and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Interval Method for Global Nonlinear Analysis. by Kolev, L Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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