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		Grid Coverage for Surveillance and Target Location in Distributed Sensor Networks by Chakrabarty, K Lyengar, V Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Test Bus Sizing for System-on-A-Chip by Lyengar, V Chakrabarty, K Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Deterministic Built-In Test Pattern Generation for High-Performance Circuits Using Twisted-Ring Counters. by Iyengar, V Murray, B. T Chakrabarty, K Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Zero-Aliasing Space Compaction of Test Responses Using Multiple Parity Signatues. by Hayes, J. P Chakrabarty, K Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Nonlinear Modeling and Bifurcations in Teh Boost Converter. by Banerjee, S Chakrabarty, K Source: Ieee Transactions on PowerElectronics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Control of Chaos in Dc-Dc Converters. by Poddar, G Chakrabarty, K Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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