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Segmental Reliability Weighting for Robust Recognition of Party Corrupted Speech by
  • Cho, H. Y
  • Kim, Y. L
  • Oh, Yung-Hwan
Source: IET:IEE: Electronics Letters
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Generalized for ward/Backward Subaperture Smoothing Techniques for Sample Starved Stap. by
  • Pillai, S. U
  • Kim, Y. L
  • Guerci, J. R
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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