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		Approaches to EvaluateVirtual Instrumenbtation Measurement Uncertainities by Nuccio, S Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Growth of Electromigration-Induced Hillocks in Al Interconnects by Nuccio, S Source: Journal of Materials Research Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Virtual Instrument for Measurement of Flicker. by Nuccio, S Caldara, S Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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