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		Simple Estimation ofEffect of Hot-Carrier Degradation on Scale Nmosfets by Seekamp, A Avellan, F Source: International Journal of Electronics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Centrifugal Pump Performance Drop Due to Leading Edge Cavitation: Numerical Predictions Compared with Model Tests. by Hirschi, R Dupont, Ph Avellan, F Source: Transactions ofAsme, Journal of Fluids Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Prediction of Cavitation Erosion: An Energy Approach. by Dupont, Ph Avellan, F Pereira, F Source: Transactions ofAsme, Journal of Fluids Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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