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Surface-Related Drain Current Dispersion Effects in Algan-Gan Hemts by
  • Meneghesso, G
  • Canali, Claudio
  • Chini, Alessandro
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Pulsed Measurements and Circuit Modeling of Weak and Strong Avalanche Effects in Gaas Mesfets and Hemts by
  • Meneghesso, Gaudenzio
  • Chini, Alessandro
  • Zanoni, Enrico
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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