Your search returned 4 results.

Results
		Structural Optimization of Sutbdg Devices for Low-Power Applications by Xiong, Shiying Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Simulation Study of Gate Line Edge Roughness Effects on Doping Profiles of Short-Channel Mosfet Devices by Xiong, Shiying Boker, Jeff Source: Ieee Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Simulation Study of Gate Iine Edge Roughness Effects on Doping Profiles of Short-Channel Mosfet Devices by Xiong, Shiying Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Sensitivity of Double-Gate and Finfet Devices to Process Variations by Xiong, Shiying Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search