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		Influence of Dielectric Breakdown on Mosfet Drain Current by Cellere, Giorgio Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Fga Effects on Plasma-Induced Damage : BeyondApperances by Cellere, Giorgio Paccagnella, Alessandro Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Micro Breakdown in Small-Area Ultrathin Gate Oxide by Cellere, Giorgio Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Plasma-Induced Micro Breakdown in Small-Area Mosfets by Cellere, Giorgio Larcher, L Valentini, M Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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