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Multiple Stuck-Open Fault Detection in Cmos Logic Circuits by
  • Jha, N. K
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Leakage Power Analysis and Reduction During Behavioral Synthesis by
  • Khouri, K.S
  • Jha, N. K
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Optmization and Realization of Sub-100-Nm Channel Length Single Halo P-Mosfets by
  • Borse, D G
  • K.N, M. Rani
  • Jha, N.K
  • Chandorkar, A. N
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Tao: Regular Expression-Based Register-Transfer Level Testability Analysis and Optimization by
  • Ravi, S. S
  • Lakshminarayana, G
  • Jha, N.K
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Cosyn: Hardware-Software Co-Synthesis of Heterogeneous Distributed Embedded Systems by
  • Dave, B.P
  • Lakshminarayana, G
  • Jha, N.K
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Power Management in High-Level Synthesis by
  • Lakshminarayana, G
  • Raghunathan, A
  • Jha, N.K
  • Dey, S
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Integration of Hierachicla Test Generation with Behavioral Synthesis of Controller and Data Circuits. by
  • Bhatia, S
  • Jha, N. K
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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