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Fault-Tolerance of Dynamic-Fuli-Access Interconnection Networks by
  • Shen, John Paul Shen
  • Hayes, John P
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Effectiveness of Microarchitecture Test. Program Generation. by
  • Shen, John Paul Shen
  • Shawn, R. D
  • Utamaphethai, Noppanunt
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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