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		Verifiction of Electron Distribution in Silicon by Means of Hot Carrier Luminescence Measurements by Selmi, Luca Mastrapasqua, M Bude, J Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Chisel Flash Eeprom-Part I: Performance and Scaling by Mahapatra, S Shukuri, S Bude, J Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Chisel Flash Eeprom-Part Ii: Reliability by Mahapatra, S Shukuri, S Bude, J Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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