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Surface Accumulated Lateral Npn Bjt'S Characteristics in Soi Nmosfet'S by
  • Kook, Y. S
  • Min, H
  • Park, Young June
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Analysis OfSpurious Negative Resistance of Pn Junction Avalanche Breakdown by
  • Hong, Sung Joon
  • Park, Young June
  • Min, H
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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