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A Unified Way of ComparingReliability of Coherent Systems by
  • Mi, Jie
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Mean Residual life and its Association with Failure Rate by
  • Mi, Jie
  • Ghai, Gauri L
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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A New Explanation of Decreasing Failure Rate of a Mixture of Exponentials by
  • Mi, Jie
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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