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		Embedded Core Test Generation Using Broadcast Test Architecture and Netlist Scrambling by Jiang, J.-H Jone, Wen-Ben Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Efficient Method for Non-Traditional Faults of Embedded Memory Arrays by Jone, Wen-Ben Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Efficirent Bist Method for Distributed Small Buffers by Jone, Wen-Ben Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Adaptive Path Selection Method for Delay Testing by Jone, Wen-Ben Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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