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		Dynamic-Stress-Induced Enhanced Degradation of 1/F Noise in N-Mosfet'S by Xu, J. P Cheng, Y.C Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Interface Properties of No-Annealed N2o-Grown Oxynitride by Lai, P. T Xu, J.P Cheng, Y.C Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Analysis on Accuracy of Charge-Pumping Measurement with Gate Sawtooth Pluses by Lai, P. T Xu, J. P Cheng, Y C Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design A Novel 5.8 Ghz Wideband Low Noise Amplifier in Cmos Technology for Wlan Applications by Lee, K H Cheng, Y C Source: International Journal of Electronics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Polling An Image By Random Lines by Cheng, Y.C Liu, Y.S Source: Ieee Transactions on Pattern Analysis and Machine Intelligence Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Global Stability Analysis for Bird-Shaped Girders. by Cheng, Y. C Duan, L Zhou, S. P Source: Asce: Journal of Structural Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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