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An Electrical Method for MeasuringDifference in Bandgap AcrossNeutral Base in Sige Hbt'S by
  • Tang, Yue T
  • Hamel, J. S
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Comments on "Modeling of Small-Signal Minority-Carrier Transport in Bipolar Devices At Arbitrary Injection Levels" by
  • Hamel, J. S
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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