Your search returned 3 results.

Results
		Theoretical Study of Deep-Trap-Assisted Anomalous Currents in Worst-Bit Celis of Dynamic Random-Access Memories (Dram'S) by Yamaguchi, Ken Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		High-Current Smali-Parasitic-Capacitance Mosfet on a Poly-Si Interlayed (Psi-)Soi Wafer by Horiuchi, M Teshima, Kszuya Yamaguchi, Ken Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Sram Immunity to Cosmic-Ray-Induced Multierrors Based on Analysis of An Induced Parasitic Bipolar Effect by Osada, Kenichi Yamaguchi, Ken Kawahara, Takayuki Source: Ieee Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search