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Obdd-Based Evaluation of K-Terminal Network Reliability by
  • Yeh, Fu-Min
  • Lu, Shyue-Kung
  • Kuo, Sy-Yen
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Determining Terminal-Pair Reliability Based on Edge Expansion Diagrams Using Obdd by
  • Kuo, Sy-Yen
  • Lu, Shyue-Kung
  • Yeh, Fu-Min
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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