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Software Reliability Growth with Test Coverage by
  • Malaiya, Yashwant K
  • li, Michael
  • Bieman, James M
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Measuring Design-Level Cohesion by
  • Bieman, James M
  • Kang, byung-Kyoo
Source: IEEE Transactions on Software Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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